Integrated Circuit Electromagnetic Immunity Handbook

March 02, 2018

Characterisation of electromagnetic susceptibility of integrated circuits using near eld scan a. Sicard a susceptibility characterisation test for integrated circuits using a miniaturemagneticnear eldprobeisdescribedthemethodisefcient up to a frequency of 6 ghz and maps immunity to radiated elds.

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Ognjen jovi c department of engineering integrated circuits methods tools and technologies robert bosch gmbh aeeim germany.

Integrated circuit electromagnetic immunity handbook. In 2000 an updated version of the integrated circuit electromagnetic immunity handbook published by nasa gave valuable information on the immunity levels of simple integrated circuits up to 10 ghz. Near field injection at silicon die level is a promising application for various area such as the analyses of integrated circuit ic susceptibility to electromagnetic interferences and. Ic is mounted on an ic test printed circuit board pcb clamped to a mating port cut in the top or bottom of a tem cell or gtem cell.

Ic emission model conducted emission is the method used to predict the electromagnetic emission at the ic 23. This handbook is built heavily on the one produced in the seventies by mcdonnell douglas astronautics company mdac mdc report e1929 of 1 august 1978 entitled integrated circuit electromagnetic susceptibility handbook known commonly as the ices handbook which has served countless systems designers for over 20 years. Issues in electromagnetic compatibility of integrated circuits.

The introduction gives general keyword definitions and principles for emission and susceptibility. Susceptibility of ics to conducted electromagnetic interference. A method for measuring the immunity to radiated electromagnetic disturbances to an integrated circuit ic.

This handbook is built heavily on the one produced in the seventies by mcdonnell douglas astronautics company mdac mdc report e1929 of 1 august 1978 entitled integrated circuit electromagnetic. One method is the linear equivalent circuit and current source leccs model which has been used for the prediction of emissions and immunity tasks 6. Hardening integrated circuits to electromagnetic interference by specific design techniques that raised the immunity level of ics from a low 15 v to more than 5 v in the frequency range 1 to 10 mhz.

This paper is focused on the electromagnetic compatibility emc of integrated circuits. In the transient regime even weak perturbations could affect switching delays and circuit thresholds.